DIN 50441-4-1999 半导体工艺用材料的试验.半导体圆片几何尺寸的测定.第4部分:圆片直径,直径变化量,扁片直径,扁片长度和扁片厚度
时间:2024-05-16 21:48:13 来源: 标准资料网 作者：标准资料网 阅读：8337
【英文标准名称】:Testingofmaterialsforsemiconductortechnology-Determinationofthegeometricdimensionsofsemiconductorwafers-Part4:Slicediameter,diamtervariation,flatdiameter,flatlength,flatdepth
【原文标准名称】:半导体工艺用材料的试验.半导体圆片几何尺寸的测定.第4部分:圆片直径,直径变化量,扁片直径,扁片长度和扁片厚度
【标准号】:DIN50441-4-1999
【标准状态】:作废
【国别】:德国
【发布日期】:1999-03
【实施或试行日期】:
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体工程;半导体;直径测量;高度;半导体片;厚度;材料;规范(验收);试验;检验;厚度测量;直径;定义;测量;无损检验;试验设备;半导体工艺
【英文主题词】:Definition;Definitions;Diameter;Diametermeasurement;Flatdepth;Flatlength;Height;Inspection;Materials;Measurement;Non-destructivetesting;Semiconductorengineering;Semiconductorslices;Semiconductortechnology;Semiconductors;Specification(approval);Testequipment;Testing;Thickness;Thicknessmeasurement
【摘要】:Themethodsaccordingtothedocumentcoverthedeterminationoftheslicediameter,diametervariation,flatdiameter,flatlengthandflatdepth.Theyarenondestructiveregardingmechanicaldamages.#,,#
【中国标准分类号】:H82
【国际标准分类号】:29_045
【页数】:8P;A4
【正文语种】:德语
【英文标准名称】:Chemicalsusedfortreatmentofwaterintendedforhumanconsumption-Sodiumhydrogensulfate;GermanversionEN16037:2012
【原文标准名称】:人类用水的水处理用化合物.硫酸氢钠.德文版本EN16037-2012
【标准号】:DINEN16037-2012
【标准状态】:现行
【国别】:德国
【发布日期】:2012-09
【实施或试行日期】:
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:锑;砷;原子吸收分光光度测定法;化学分析和试验;化学元素和无机化合物;化合物;交付;含量测定;饮用水;饮用水处理;吸湿性;标志;饮水;纯度;杂质试验;质量;安全标志;硒;钠;钠酸硫酸盐;存储;试验;运输;处理;应用;水;水常规(实验);水净化;给水;水处理
【英文主题词】:Antimony;Arsenic;Atomicabsorptionspectrophotometry;Chemicalanalysisandtesting;Chemicalelementsandinorganiccompounds;Chemicals;Delivery;Determinationofcontent;Drinkingwater;Drinkingwatertreatment;Hygroscopic;Marking;Potablewater;Purity;Puritytest;Quality;Safetymarkings;Selenium;Sodium;Sodiumacidsulphate;Storage;Testing;Transport;Treatment;Use;Water;Waterpractice;Waterpurification;Watersupply;Watertreatment
【摘要】:
【中国标准分类号】:G77
【国际标准分类号】:71_100_80
【页数】:27P;A4
【正文语种】:德语
MIL-STD-188/125-2, DEPARTMENT OF DEFENSE INTERFACE STANDARD: HIGH-ALTITUDE ELECTROMAGNETIC PULSE (HEMP) PROTECTION FOR GROUND-BASED C4I FACILITIES PERFORMING CRITICAL, TIME-URGENT MISSIONS, (PART 2 - TRANSPORTABLE SYSTEMS) (03 MAR 1999)., This standard prescribes minimum performance requirements for low-risk protection from mission-aborting damage or upset due to HEMP threat environments defined in MIL-STD-2169. The standard also addresses minimum testing requirements for demonstrating that prescribed performance has been achieved and for verifying that the installed protection measures provide the operationally required HEMP hardness for the completed system. If the prescribed testing results in any hardware damage or functional upsets, the operational authority for the system will make the determination whether the observed event is mission aborting.